Improve status messages on self-test finish. (#1086)

* Improve status messages on self-test finish. This doesn't change the logic, but does change the messaging to the user, mainly on a failed self-test which was started by pressing the BOOT button on start-up. Also moved display logic into self-test for clarity. Fixes #1076 * Missed some renamed variable * Improve wording * Wait on boot button is only for failed factory self-test * Add logging line * Call nvs_commit before esp_restart * More logging * Test boot button after factory self-test check
2025-10-08 18:16:57 +02:00 · 2025-06-27 17:58:14 +02:00
parent c9cca926d5
commit 6711078839
7 changed files with 99 additions and 72 deletions
--- a/config-custom.cvs
+++ b/config-custom.cvs
@@ -47,5 +47,5 @@ DS4432U,data,u16,0
 INA260,data,u16,0
 # TPS546 (0,1)
 TPS546,data,u16,1
-# Self Test Power Consumption Target (> 0)
+# Self-test Power Consumption Target (> 0)
 power_cons_tgt,data,u16,12
--- a/flashing.md
+++ b/flashing.md
@@ -17,4 +17,4 @@ You can flash [factory images](https://github.com/bitaxeorg/ESP-Miner/releases)
 - Keep waiting until the console on ESP Tool says "Leaving..."
 - If you are _sure_ you have seen ESP Tool say "Leaving..." then you're bitaxe might restart.
 - If you bitaxe hasn't restarted, you can press the RESET button on the bitaxe
- The self test should run. this can take a second. You'll need to press the RESET button on the bitaxe once the self test has passed.
+- The self-test should run. this can take a second. You'll need to press the RESET button on the bitaxe once the self-test has passed.
--- a/main/global_state.h
+++ b/main/global_state.h
@@ -75,10 +75,11 @@ typedef struct

 typedef struct
 {
-    bool active;
+    bool is_active;
+    bool is_finished;
    char *message;
-    bool result;
-    bool finished;
+    char *result;
+    char *finished;
 } SelfTestModule;

 typedef struct
--- a/main/nvs_config.c
+++ b/main/nvs_config.c
@@ -166,3 +166,20 @@ void nvs_config_set_u64(const char * key, const uint64_t value)
    }
    nvs_close(handle);
 }
+
+void nvs_config_commit()
+{
+    nvs_handle handle;
+    esp_err_t err;
+    err = nvs_open(NVS_CONFIG_NAMESPACE, NVS_READWRITE, &handle);
+    if (err != ESP_OK) {
+        ESP_LOGW(TAG, "Could not open nvs");
+        return;
+    }
+
+    err = nvs_commit(handle);
+    if (err != ESP_OK) {
+        ESP_LOGW(TAG, "Could not commit nvs");
+    }
+    nvs_close(handle);
+}
--- a/main/nvs_config.h
+++ b/main/nvs_config.h
@@ -65,5 +65,6 @@ int32_t nvs_config_get_i32(const char * key, const int32_t default_value);
 void nvs_config_set_i32(const char * key, const int32_t value);
 uint64_t nvs_config_get_u64(const char * key, const uint64_t default_value);
 void nvs_config_set_u64(const char * key, const uint64_t value);
+void nvs_config_commit(void);

 #endif // MAIN_NVS_CONFIG_H
--- a/main/screen.c
+++ b/main/screen.c
@@ -96,7 +96,7 @@ static lv_obj_t * create_scr_self_test() {
    lv_obj_t * scr = create_flex_screen(4);

    lv_obj_t *label1 = lv_label_create(scr);
-    lv_label_set_text(label1, "BITAXE SELF TEST");
+    lv_label_set_text(label1, "BITAXE SELF-TEST");

    self_test_message_label = lv_label_create(scr);
    self_test_result_label = lv_label_create(scr);
@@ -318,23 +318,17 @@ static void screen_update_cb(lv_timer_t * timer)
        }
    }

-    if (GLOBAL_STATE->SELF_TEST_MODULE.active) {
+    if (GLOBAL_STATE->SELF_TEST_MODULE.is_active) {
        screen_show(SCR_SELF_TEST);

        SelfTestModule * self_test = &GLOBAL_STATE->SELF_TEST_MODULE;

        lv_label_set_text(self_test_message_label, self_test->message);

-        if (self_test->finished && !self_test_finished) {
+        if (self_test->is_finished && !self_test_finished) {
            self_test_finished = true;
-
-            if (self_test->result) {
-                lv_label_set_text(self_test_result_label, "TESTS PASS!");
-                lv_label_set_text(self_test_finished_label, "Press RESET button to start Bitaxe.");
-            } else {
-                lv_label_set_text(self_test_result_label, "TESTS FAIL!");
-                lv_label_set_text(self_test_finished_label, "Hold BOOT button for 2 seconds to cancel self test, or press RESET to run again.");
-            }
+            lv_label_set_text(self_test_result_label, self_test->result);
+            lv_label_set_text(self_test_finished_label, self_test->finished);
        }

        return;
--- a/main/self_test/self_test.c
+++ b/main/self_test/self_test.c
@@ -35,9 +35,6 @@

 #define GPIO_ASIC_ENABLE CONFIG_GPIO_ASIC_ENABLE

-#define TESTS_FAILED 0
-#define TESTS_PASSED 1
-
 /////Test Constants/////
 //Test Fan Speed
 #define FAN_SPEED_TARGET_MIN 1000 //RPM
@@ -51,30 +48,28 @@

 static const char * TAG = "self_test";

-SemaphoreHandle_t BootSemaphore;
+static SemaphoreHandle_t longPressSemaphore;
+static bool isFactoryTest = false;

 //local function prototypes
 static void tests_done(GlobalState * GLOBAL_STATE, bool test_result);

-static bool should_test(GlobalState * GLOBAL_STATE) {
-    // Optionally hold the boot button
-    if (gpio_get_level(CONFIG_GPIO_BUTTON_BOOT) == 0) { // LOW when pressed
+static bool should_test() {
+    uint64_t is_factory_flash = nvs_config_get_u64(NVS_CONFIG_BEST_DIFF, 0) < 1;
+    uint16_t is_self_test_flag_set = nvs_config_get_u16(NVS_CONFIG_SELF_TEST, 0);
+    if (is_factory_flash && is_self_test_flag_set) {
+        isFactoryTest = true;
        return true;
    }

-    bool is_max = GLOBAL_STATE->DEVICE_CONFIG.family.asic.id == BM1397;
-    uint64_t best_diff = nvs_config_get_u64(NVS_CONFIG_BEST_DIFF, 0);
-    uint16_t should_self_test = nvs_config_get_u16(NVS_CONFIG_SELF_TEST, 0);
-    if (should_self_test == 1 && !is_max && best_diff < 1) {
-        return true;
-    }
-    return false;
+    // Optionally start self-test when boot button is pressed
+    return gpio_get_level(CONFIG_GPIO_BUTTON_BOOT) == 0; // LOW when pressed
 }

 static void reset_self_test() {
    ESP_LOGI(TAG, "Long press detected...");
    // Give the semaphore back
-    xSemaphoreGive(BootSemaphore);
+    xSemaphoreGive(longPressSemaphore);
 }

 static void display_msg(char * msg, GlobalState * GLOBAL_STATE) 
@@ -201,7 +196,7 @@ esp_err_t test_voltage_regulator(GlobalState * GLOBAL_STATE) {
    if (init_voltage_regulator(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "VCORE init failed!");
        display_msg("VCORE:FAIL", GLOBAL_STATE);
-        //tests_done(GLOBAL_STATE, TESTS_FAILED);
+        //tests_done(GLOBAL_STATE, false);
        return ESP_FAIL;
    }

@@ -210,7 +205,7 @@ esp_err_t test_voltage_regulator(GlobalState * GLOBAL_STATE) {
        if (DS4432U_test() != ESP_OK) {
            ESP_LOGE(TAG, "DS4432 test failed!");
            display_msg("DS4432U:FAIL", GLOBAL_STATE);
-            //tests_done(GLOBAL_STATE, TESTS_FAILED);
+            //tests_done(GLOBAL_STATE, false);
            return ESP_FAIL;
        }
    }
@@ -263,19 +258,23 @@ bool self_test(void * pvParameters)
 {
    GlobalState * GLOBAL_STATE = (GlobalState *) pvParameters;

-    // Should we run the self test?
-    if (!should_test(GLOBAL_STATE)) return false;
+    // Should we run the self-test?
+    if (!should_test()) return false;

-    ESP_LOGI(TAG, "Running Self Tests");
+    if (isFactoryTest) {
+        ESP_LOGI(TAG, "Running factory self-test");
+    } else {
+        ESP_LOGI(TAG, "Running manual self-test");
+    }

-    GLOBAL_STATE->SELF_TEST_MODULE.active = true;
+    GLOBAL_STATE->SELF_TEST_MODULE.is_active = true;

    // Create a binary semaphore
-    BootSemaphore = xSemaphoreCreateBinary();
+    longPressSemaphore = xSemaphoreCreateBinary();

    gpio_install_isr_service(0);

-    if (BootSemaphore == NULL) {
+    if (longPressSemaphore == NULL) {
        ESP_LOGE(TAG, "Failed to create semaphore");
        return true;
    }
@@ -283,48 +282,48 @@ bool self_test(void * pvParameters)
    //Run PSRAM test
    if(test_psram(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "NO PSRAM on device!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //Run display tests
    if (test_display(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "Display test failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //Run input tests
    if (test_input(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "Input test failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //Run screen tests
    if (test_screen(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "Screen test failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //Init peripherals EMC2101 and INA260 (if present)
    if (test_init_peripherals(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "Peripherals init failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //Voltage Regulator Testing
    if (test_voltage_regulator(GLOBAL_STATE) != ESP_OK) {
        ESP_LOGE(TAG, "Voltage Regulator test failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    if (asic_reset() != ESP_OK) {
        ESP_LOGE(TAG, "ASIC reset failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //test for number of ASICs
    if (SERIAL_init() != ESP_OK) {
        ESP_LOGE(TAG, "SERIAL init failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    GLOBAL_STATE->POWER_MANAGEMENT_MODULE.frequency_value = nvs_config_get_u16(NVS_CONFIG_ASIC_FREQ, CONFIG_ASIC_FREQUENCY);
@@ -335,11 +334,11 @@ bool self_test(void * pvParameters)
    ESP_LOGI(TAG, "%u chips detected, %u expected", chips_detected, chips_expected);

    if (chips_detected != chips_expected) {
-        ESP_LOGE(TAG, "SELF TEST FAIL, %d of %d CHIPS DETECTED", chips_detected, chips_expected);
+        ESP_LOGE(TAG, "SELF-TEST FAIL, %d of %d CHIPS DETECTED", chips_detected, chips_expected);
        char error_buf[20];
        snprintf(error_buf, 20, "ASIC:FAIL %d CHIPS", chips_detected);
        display_msg(error_buf, GLOBAL_STATE);
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //test for voltage regulator faults
@@ -348,7 +347,7 @@ bool self_test(void * pvParameters)
        char error_buf[20];
        snprintf(error_buf, 20, "VCORE:PWR FAULT");
        display_msg(error_buf, GLOBAL_STATE);
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    //setup and test hashrate
@@ -357,7 +356,7 @@ bool self_test(void * pvParameters)

    if (SERIAL_set_baud(baud) != ESP_OK) {
        ESP_LOGE(TAG, "SERIAL set baud failed!");
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    GLOBAL_STATE->ASIC_TASK_MODULE.active_jobs = malloc(sizeof(bm_job *) * 128);
@@ -446,14 +445,14 @@ bool self_test(void * pvParameters)

    if (hash_rate < expected_hashrate_mhs) {
        display_msg("HASHRATE:FAIL", GLOBAL_STATE);
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    free(GLOBAL_STATE->ASIC_TASK_MODULE.active_jobs);
    free(GLOBAL_STATE->valid_jobs);

    if (test_core_voltage(GLOBAL_STATE) != ESP_OK) {
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

    // TODO: Maybe make a test equivalent for test values
@@ -461,46 +460,61 @@ bool self_test(void * pvParameters)
        if (test_INA260_power_consumption(GLOBAL_STATE->DEVICE_CONFIG.power_consumption_target, POWER_CONSUMPTION_MARGIN) != ESP_OK) {
            ESP_LOGE(TAG, "INA260 Power Draw Failed, target %.2f", (float)GLOBAL_STATE->DEVICE_CONFIG.power_consumption_target);
            display_msg("POWER:FAIL", GLOBAL_STATE);
-            tests_done(GLOBAL_STATE, TESTS_FAILED);
+            tests_done(GLOBAL_STATE, false);
        }
    }
    if (GLOBAL_STATE->DEVICE_CONFIG.TPS546) {
        if (test_TPS546_power_consumption(GLOBAL_STATE->DEVICE_CONFIG.power_consumption_target, POWER_CONSUMPTION_MARGIN) != ESP_OK) {
            ESP_LOGE(TAG, "TPS546 Power Draw Failed, target %.2f", (float)GLOBAL_STATE->DEVICE_CONFIG.power_consumption_target);
            display_msg("POWER:FAIL", GLOBAL_STATE);
-            tests_done(GLOBAL_STATE, TESTS_FAILED);
+            tests_done(GLOBAL_STATE, false);
        }
    }

    if (test_fan_sense(GLOBAL_STATE) != ESP_OK) {     
        ESP_LOGE(TAG, "Fan test failed!"); 
-        tests_done(GLOBAL_STATE, TESTS_FAILED);
+        tests_done(GLOBAL_STATE, false);
    }

-    tests_done(GLOBAL_STATE, TESTS_PASSED);
+    tests_done(GLOBAL_STATE, true);

    return true;
 }

-static void tests_done(GlobalState * GLOBAL_STATE, bool test_result) 
+static void tests_done(GlobalState * GLOBAL_STATE, bool isTestPassed) 
 {
-    GLOBAL_STATE->SELF_TEST_MODULE.result = test_result;
-    GLOBAL_STATE->SELF_TEST_MODULE.finished = true;
    VCORE_set_voltage(0.0f, GLOBAL_STATE);

-    if (test_result == TESTS_FAILED) {
-        ESP_LOGI(TAG, "SELF TESTS FAIL -- Press RESET to continue");  
-        while (1) {
-            // Wait here forever until reset_self_test() gives the BootSemaphore
-            if (xSemaphoreTake(BootSemaphore, portMAX_DELAY) == pdTRUE) {
-                nvs_config_set_u16(NVS_CONFIG_SELF_TEST, 0);
-                //wait 100ms for nvs write to finish?
-                vTaskDelay(100 / portTICK_PERIOD_MS);
-                esp_restart();
-            }
+    if (isTestPassed) {
+        if (isFactoryTest) {
+            ESP_LOGI(TAG, "Self-test flag cleared");
+            nvs_config_set_u16(NVS_CONFIG_SELF_TEST, 0);
        }
+        ESP_LOGI(TAG, "SELF-TEST PASS! -- Press RESET button to restart.");
+        GLOBAL_STATE->SELF_TEST_MODULE.result = "SELF-TEST PASS!";
+        GLOBAL_STATE->SELF_TEST_MODULE.finished = "Press RESET button to restart.";
    } else {
-        nvs_config_set_u16(NVS_CONFIG_SELF_TEST, 0);
-        ESP_LOGI(TAG, "Self Tests Passed!!!");
+        // isTestFailed
+        GLOBAL_STATE->SELF_TEST_MODULE.result = "SELF-TEST FAIL!";
+        if (isFactoryTest) {
+            ESP_LOGI(TAG, "SELF-TEST FAIL! -- Hold BOOT button for 2 seconds to cancel self-test, or press RESET to run self-test again.");
+            GLOBAL_STATE->SELF_TEST_MODULE.finished = "Hold BOOT button for 2 seconds to cancel self-test, or press RESET to run self-test again.";
+            GLOBAL_STATE->SELF_TEST_MODULE.is_finished = true;
+            while (1) {
+                // Wait here forever until reset_self_test() gives the longPressSemaphore
+                if (xSemaphoreTake(longPressSemaphore, portMAX_DELAY) == pdTRUE) {
+                    ESP_LOGI(TAG, "Self-test flag cleared");
+                    nvs_config_set_u16(NVS_CONFIG_SELF_TEST, 0);
+                    // flush all pending NVS writes
+                    nvs_config_commit();
+                    esp_restart();
+                }
+            }
+        } else {
+            ESP_LOGI(TAG, "SELF-TEST FAIL -- Press RESET button to restart.");
+            GLOBAL_STATE->SELF_TEST_MODULE.finished = "Press RESET button to restart.";
+        }
+        
    }
+    GLOBAL_STATE->SELF_TEST_MODULE.is_finished = true;
 }